Minutes, IBIS Quality Committee 24 November 2009 11-12 AM EST (8-9 AM PST) ROLL CALL Adam Tambone Anders Ekholm, Ericsson Barry Katz, SiSoft Benny Lazer Benjamin P Silva Bob Cox, Micron Bob Ross, Teraspeed Consulting Group Brian Arsenault David Banas, Xilinx * Eckhard Lenski, Nokia Siemens Networks Eric Brock Guan Tao, Huawei Technologies Gregory R Edlund Hazem Hegazy Huang Chunxing, Huawei Technologies John Figueroa John Angulo, Mentor Graphics Katja Koller, Nokia Siemens Networks Kevin Fisher Kim Helliwell, LSI Logic * Lance Wang, IOMethodology Lijun, Huawei Lynne Green, Green Streak Programs * Mike LaBonte, Cisco Systems Mike Mayer, SiSoft * Moshiul Haque, Micron Technology Muniswarareddy Vorugu, ARM Ltd Pavani Jella, TI Peter LaFlamme Randy Wolff, Micron Technology Radovan Vuletic, Qimonda Robert Haller, Enterasys Roy Leventhal, Leventhal Design & Communications Sherif Hammad, Mentor Graphics * Tim Coyle, Signal Consulting Group Todd Westerhoff, SiSoft Tom Dagostino, Teraspeed Consulting Group Kazuyoshi Shoji, Hitachi Sadahiro Nonoyama Everyone in attendance marked by * NOTE: "AR" = Action Required. -----------------------MINUTES --------------------------- Mike LaBonte conducted the meeting. Call for opens and patent disclosures: - No one declared a patent. - Mike: There will be no meeting Dec 8 AR Review: - Mike notify ibis and ibis-quality lists about correlation discussions - No email yet - Moshiul rework IQ checklist for IQ 2.0 - Not done yet - Mike: Bita Edwards from Motorola had inquired if this would be updated New items: Mike showed the IBIS Healing Tool: - It fixes some but not all problems found in IBIS files - Moshiul: Can it convert an IBIS file to 4.2 with new features? - Mike: No, it only changes the [IBIS ver] - Moshiul: There is some tool out there to help with that - Mike: Ordinarily IBIS tools are only able to add limited IBIS keywords - C_comp, I-V and V-T tables beginning with IBIS 2.1 - Golden waveforms beginning with IBIS 3.1 - Current waveforms beginning with IBIS 5.0 - Everything must be input from the datasheet or other sources Correlation: - Mike: We looked at the Accuracy Handbook last week - Tim: There should be a balance between being powerful and useful - It should have mfg test loads from the datasheet - Also some basic tline fixtures - The Accuracy Handbook has its Figure of Merit - David and Roy did Feature-Selective Verification - This is basically what is used for my work - Vendors have trouble understanding what loads to use - Some provide overlay waveforms without much analysis in quality reports - Lance: Feature-Selective Verification tries to break it down to separate parameters? - Tim: Yes - Lance: People need to know how good the whole file is - Tim: Good point - Vendors have to decide what they are comfortable with - Mike: Is there a need for a standardized quality reports? - Moshiul: No one has asked for that - They want to see some kind of correlation - Mike: Will users want IC vendors to test in every simulator? - Tim: It shouldn't have to be tested in every IBIS simulator - Mike: There are differences between IBIS simulators - It depends on the model contents - Moshiul: Users only care that it works in the tool they are using - Lance: People who use a different simulator need to validate - Eckhard: We do the usual checks on incoming models - For correlation we try an overlay - Sim results against built-in waveforms - Tim: Vendors are not likely to release models with [Test Data] - Accuracy issues might be exposed - Mike: Bob Ross noted that [Test Data] adds greatly to the file size - Also there is no support for input stimulus patterns - Tim: There may be some enhancements related to that - Mike: We should discuss test fixtures - Most agree that a T-line fixture is needed - Tim: I could give a presentation on using test data and correlation Meeting ended at 11:58 PM Eastern Time.